On-chip receiver sensitivity test mechanism

专利名称：On-chip receiver sensitivity test mechanism发明人：Elida Isabel de Obaldia,Dirk Leipold,Oren

Eliezer,Ran Katz,Bogdan Staszewski

申请号：US11835274申请日：20070807公开号：US07958408B2公开日：20110607

专利附图：

摘要：An on-chip receiver sensitivity test mechanism for use in an integrated RFtransmitter wherein the transmitter and the receiver share the same oscillator. Themechanism obviates the need to use expensive RF signal generator test equipment with

built-in modulation capability and instead permits the use of very low cost external RFtest equipment. The invention utilizes circuitry already existing in the transceiver, namelythe modulation circuitry and local oscillators to perform sensitivity testing. The on-chipLO is used to generate the modulated test signal that otherwise would need to beprovided by expensive external RF test equipment with modulation capability. Themodulated LO signal is mixed with an externally generated unmodulated CW RF signal togenerate a modulated signal at IF which is subsequently processed by the remainder ofthe receiver chain. The recovered data bits are compared using an on-chip BER meter orcounter and a BER reading is generated. The BER reading is used either externally or byan on-chip processor or controller to establish a pass/fail indication for the chip.

申请人：Elida Isabel de Obaldia,Dirk Leipold,Oren Eliezer,Ran Katz,Bogdan Staszewski

地址：Dallas TX US,Plano TX US,Plano TX US,Givataim IL,Garland TX US

国籍：US,US,US,IL,US

代理人：Ronald O. Neerings,Wade James Brady, III,Frederick J. Telecky, Jr.

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